By Peter W. Hawkes
Advances in Imaging and Electron Physics merges long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This sequence positive aspects prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technology and electronic picture processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in some of these domains.
- Contributions from major overseas students and experts
- Discusses scorching subject components and offers present and destiny learn trends
- Invaluable reference and advisor for physicists, engineers and mathematicians
Read or Download Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 PDF
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Extra info for Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 by Peter W. Hawkes